Circuits, architectures, apparatuses, systems, algorithms, and methods for memory with multiple power supplies and/or multiple low power modes

ABSTRACT

Circuits, architectures, a system and methods for memories with multiple power supplies and/or multiple low power modes. The circuit generally includes peripheral circuitry operating at a first voltage, a memory array operating at a second voltage, and translation circuitry configured to receive an input from the peripheral circuitry at the first voltage and provide an output to the memory array at the second voltage, the translation circuitry further configured to prevent leakage during a standard operating mode of the memory. The method generally includes operating peripheral circuitry at a first voltage from a first power rail, operating a memory array at the first voltage or a second voltage, the memory array being coupled to a second power rail, coupling the first and second power rails during standard operating mode when the memory array operates at the first voltage, otherwise not coupling the first and second power rails, and reducing leakage in the memory array during a leakage reduction mode by reducing a voltage differential between a ground plane in the memory array and the second power rail.

RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No.14/077,634, filed on Nov. 12, 2013, which is a continuation of U.S. Pat.No. 8,605,534, filed on Sep. 9, 2010, which claims the benefit of U.S.Provisional Patent Application Nos. 61/240,948, filed Sep. 9, 2009 andentitled “Dual Supply Memory System For Low Power/Low LeakageOperation,” and 61/288,064, filed Dec. 18, 2009 and entitled “DualSupply Memory System For Low Power/Low Leakage Operation,” each of whichis incorporated herein by reference in its entirety.

FIELD OF THE INVENTION

The present invention generally relates to the field of memories withmultiple power supplies and/or multiple low power modes. Morespecifically, embodiments pertain to circuits, architectures,apparatuses, systems, methods, and algorithms for a memory systememploying one or more power supplies and/or for reducing the powerconsumed (e.g., by operational circuitry or through leakage current) bya memory and in systems employing the memory.

BACKGROUND

Conventional memory chips generally comprise peripheral control logicand at least one memory array comprising a plurality of memory cells. Insome chips, the memory control logic is coupled to the memory array viaa translation circuit (e.g., a voltage converter). A translation circuitconverts one fixed supply voltage from an external power supply to adifferent operating voltage suitable for the memory array. Typically,the memory cells operate at a minimum reliable operating voltage forstoring and erasing information. In certain embodiments, the powersupplies are each provided by an external power supply.

As illustrated in system 10 of FIG. 1A, a first fixed voltage V_(CC1) isprovided to memory chip 12 from a power supply 50 on power supply line55. The voltage V_(CC1) is provided on power rail 25 to logic circuitryin a peripheral region 20 of the chip 12, and to a voltage translationcircuit (not shown) in translation region 30. The voltage translationcircuit (e.g., a two-stage level-shifting circuit) is generallyconfigured to increase or decrease the first voltage V_(CC1) to a secondfixed voltage V_(CC2) from power rail 45 in memory array 40, where thevoltage V_(CC2) on the power rail 45 is different from the voltageV_(CC1) in peripheral region 20. In certain conventional systems, thevoltage V_(CC2) provided to memory array 40 is greater than that of thevoltage V_(CC1) provided to peripheral circuit 20. The voltage V_(CC2)provided to the voltage translation circuit in the translation region 30via voltage supply line 35 is generally the minimum reliable operatingvoltage at which the memory cells (not shown) in the memory array 40 canstore and erase information. However, the typical two-stage translationcircuitry in the translation region 30 introduces latency (e.g., thetime to convert signals at the voltage V_(CC1) supplied to theperipheral region 20 to signals at the voltage V_(CC2) for the memoryarray).

FIG. 1B illustrates an alternative system 57 that includes a memorycontroller 70, a system power supply 50, a level shifter (L/S) 32, andmemory chip 16. The system power supply 50 provides power to the memorycontroller 70. In such systems, the memory chip 16 may require a greatersupply voltage than that provided by the system power supply 50. Levelshifter 32 is located outside of the memory chip 16, between systemcontrol signal 72 (such as a read enable or write enable signal) fromthe memory controller 70 and input 18 to the memory chip 16. In somecases, more than one level shifter 32 is required. The level shifter(s)32 consume significant board or system-on-chip (SOC) area and addsignificant delay, and are burdensome to the system designer as aresult.

FIG. 1C illustrates a second conventional memory system 60 that utilizesa power supply 50 to provide power to a memory chip 14. Specifically,power supply 50 provides a fixed voltage V_(CC) to both peripheralcircuitry 22 and to memory array 42 through power supply line 65. Memorychip 14 is generally configured to operate at a voltage (e.g., V_(CC))greater than that of the minimum voltage required for the logic in theperipheral region 22 and/or for the cells (not shown) in the memoryarray 42 to retain data. As a result, the circuitry in the peripheralregion 22 or the memory array 42 may operate at a voltage greater thanits minimum required operating voltage. Operating circuitry at a voltagegreater than the minimum required voltage increases power consumptionand reduces the efficiency of the circuitry.

This “Background” section is provided for background information only.The statements in this “Background” are not an admission that thesubject matter disclosed in this “Background” section constitutes priorart to the present disclosure, and no part of this “Background” sectionmay be used as an admission that any part of this application, includingthis “Background” section, constitutes prior art to the presentdisclosure.

SUMMARY

Embodiments of the present invention relate to circuitry, architectures,apparatuses, systems, methods, algorithms and software for memories withmultiple power supplies and/or multiple low power and/or leakagereduction modes. In one aspect, the circuitry generally comprisesperipheral circuitry operating at a first voltage, a memory arrayoperating at a second voltage, and translation circuitry configured toreceive an input from the peripheral circuitry at the first voltage andprovide an output to the memory array at the second voltage, thetranslation circuitry further configured to prevent leakage during astandard operating mode of the memory. The architectures and/or systemsgenerally comprise those that include a circuit embodying one or more ofthe inventive concepts disclosed herein.

In another aspect, the circuitry generally comprises peripheralcircuitry receiving a first voltage from a peripheral power rail, amemory array receiving the first voltage or a second voltage from amemory array power rail, a diode or a bias source coupled seriallybetween a ground plane in the memory array and an external groundpotential, and a leakage reduction switch coupled to the ground plane inthe memory array and the external ground potential, the leakagereduction switch configured to bypass the diode or the bias source whenthe memory is in the standard operating mode. In general, opening theleakage reduction switch places the memory in a leakage reduction mode.In further embodiments, one or more power-down switches can beconfigured to disconnect the peripheral power rail and/or the memoryarray power rail (at least in part) from the corresponding power supply(or power supplies) in various power-down modes.

The methods generally comprise operating peripheral circuitry at a firstvoltage from a first power rail, operating a memory array at the firstvoltage or a second voltage, the second voltage being different from thefirst voltage, and the memory array being coupled to a second powerrail, coupling the first and second power rails during standardoperating mode when the memory array operates at the first voltage,otherwise not coupling the first and second power rails, and reducingleakage in the memory array during a power down/leakage reduction modeby reducing a voltage differential between a ground plane in the memoryarray and the second power rail by a predetermined amount.

The present disclosure advantageously provides circuitry for providingmultiple power levels to a memory chip, for reducing the power (e.g.,the operating voltage) to the peripheral circuitry and/or the memoryarray, for translating signals at a peripheral voltage to a memory arrayvoltage without consuming significant additional area or introducingcurrent leakage, for reducing the latency of such signal translationrelative to conventional translation circuitry (which can beparticularly detrimental in high frequency designs; see, e.g., theembodiments of FIGS. 1B-1C), and for reducing current leakage in thememory array and/or between the memory array and the peripheralcircuitry. More specifically, the present disclosure provides a dualpower supply memory having numerous power and/or leakage reduction modesand/or low system power (e.g., VDD) operation, while eliminatingconventional level shifting circuitry at the memory array interface. Inaddition to reducing power consumed by the peripheral circuitry in amemory, the present disclosure reduces total system power consumption asa result of the dual supply architecture, because a relatively lowsystem supply voltage can be used. The present disclosure also providesa memory that can operate with a single power supply and having multiplepower reduction and/or leakage reduction modes.

These and other advantages of the present invention will become readilyapparent from the detailed description of preferred embodiments below.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1A-C are diagrams showing conventional memory systems.

FIG. 2 is a pin (or input/output) diagram of a memory in accordance withan example of the present disclosure.

FIG. 3 is a timing diagram illustrating methods or modes of powerreduction and/or current leakage reduction for the memory of FIG. 2.

FIG. 4 is a diagram illustrating a first memory system comprising dualpower supplies in accordance with the present disclosure.

FIG. 5 is a more detailed diagram of a memory in accordance with thememory system of FIG. 4.

FIG. 6A is a block diagram of a translation circuit in accordance withthe memory of FIG. 5.

FIG. 6B is a schematic in accordance with the translation circuit ofFIG. 6A.

FIG. 7 is a diagram of read circuitry in accordance with the memory ofFIG. 4.

FIGS. 8A-B are diagrams illustrating memory systems having a singlepower supply in accordance with the present disclosure.

FIGS. 9A-B are diagrams illustrating memory systems providing differentvoltages to the peripheral circuitry and the memory array of a memory inaccordance with the present disclosure.

FIGS. 10A-B are diagrams illustrating memory systems having variouspower and/or leakage reduction modes in accordance with the presentdisclosure.

FIG. 11 is a flow diagram showing a method of entering power-down and/orleakage reduction modes of operation in accordance with the presentdisclosure.

DETAILED DESCRIPTION

Reference will now be made in detail to various embodiments of theinvention, examples of which are illustrated in the accompanyingdrawings. While the invention will be described in conjunction with theembodiments provided below, the embodiments are not intended to limitthe invention. On the contrary, the invention is intended to coveralternatives, modifications and equivalents that may be included withinthe scope of the invention as defined by the appended claims.Furthermore, in the following detailed description of the presentinvention, numerous specific details are set forth in order to provide athorough understanding of the present invention. However, the presentinvention may be practiced without these specific details. In otherinstances, well-known methods, procedures, components, and circuits havenot been described in detail so as not to unnecessarily obscure aspectsof the present invention.

Some portions of the detailed descriptions which follow are presented interms of processes, procedures, logic blocks, functional blocks,processing, and other symbolic representations of operations on databits, data streams or waveforms within a computer, processor, controllerand/or memory. These descriptions and representations are generally usedby those skilled in the data processing arts to effectively convey thesubstance of their work to others skilled in the art. A process,procedure, logic block, function, operation, etc., is herein, and isgenerally, considered to be a self-consistent sequence of steps orinstructions leading to a desired and/or expected result. The stepsgenerally include physical manipulations of physical quantities.Usually, though not necessarily, these quantities take the form ofelectrical, magnetic, optical, or quantum signals capable of beingstored, transferred, combined, compared, and otherwise manipulated in acomputer, data processing system, or logic circuit. It has provenconvenient at times, principally for reasons of common usage, to referto these signals as bits, waves, waveforms, streams, values, elements,symbols, characters, terms, numbers, or the like.

All of these and similar terms are associated with the appropriatephysical quantities and are merely convenient labels applied to thesequantities. Unless specifically stated otherwise and/or as is apparentfrom the following discussions, it is appreciated that throughout thepresent application, discussions utilizing terms such as “processing,”“operating,” “computing,” “determining,” or the like, refer to theaction and processes of a computer, data processing system, logiccircuit or similar processing device (e.g., an electrical, optical, orquantum computing or processing device), that manipulates and transformsdata represented as physical (e.g., electronic) quantities. The termsrefer to actions, operations and/or processes of the processing devicesthat manipulate or transform physical quantities within the component(s)of a system or architecture (e.g., registers, memories, other suchinformation storage, transmission or display devices, etc.) into otherdata similarly represented as physical quantities within othercomponents of the same or a different system or architecture.

Furthermore, for the sake of convenience and simplicity, the terms“clock,” “time,” “period” and “frequency” are generally usedinterchangeably herein, but are generally given their art-recognizedmeanings. Also, for convenience and simplicity, the terms “data,” and“waveform” and “information” may be used interchangeably, as may theterms “connected to,” “coupled with,” “coupled to,” and “incommunication with” (which terms also refer to direct and/or indirectrelationships between the connected, coupled and/or communicationelements unless the context of the term's use unambiguously indicatesotherwise), but these terms are also generally given theirart-recognized meanings.

The invention, in its various aspects, will be explained in greaterdetail below with regard to various embodiments.

A First Memory with Multiple Power Supplies

FIG. 2 shows a memory 100 receiving dual power supplies, in accordancewith the present disclosure. The memory 100 can be a chip (e.g., apackaged monolithic die), a block of circuitry or circuit module on acommon semiconductor substrate, etc. A first power supply terminal 101receives a first voltage VDDS for a peripheral region of the memory 100,and a second power supply terminal 102 receives a second voltage VDDMCfor the memory array. In various embodiments, VDDMC (which may be, e.g.,from 0.9V to 5V) is greater than VDDS (which may be, e.g., from 0.8V to3.3V). Power down terminals 103, 104, and 105 (PDWN, PDLVMC, andPDFVSSM) control various power down modes and/or leakage reductionmodes.

In one embodiment, the memory 100 comprises a synchronous two-port(e.g., a data input port at the DIN[n:0] terminal 114, and a data outputport at the DOUT[n:0] terminal 115) memory with a dual power supplyarchitecture. In other embodiments, the memory 100 can be single-port ormulti-port (e.g., 3, 4, or more ports). Also, the memory 100 can beasynchronous (e.g., with respect to all ports or just between certainpredetermined ports). For example, in a 4-port memory, each of the tworead ports may be synchronous with respect to each other, butasynchronous with respect to each of the two write ports (and viceversa). The memory 100 can be manufactured, for example, on anyconventional CMOS manufacturing process (e.g., a TSMC 40 nm, 65 nm, or90 nm process, etc.).

In one embodiment, the memory array utilizes a first power supply (e.g.,VDDMC), and memory interface and/or control circuitry (e.g., peripheralcircuitry) utilizes a second power supply (e.g., VDDS). A multiple powersupply architecture facilitates low system power requirements andreduces standby leakage. The present memory 100 having multiple powersupplies minimizes the level-shifting requirement generally seen inconventional memory systems by using low-latency voltage translationcircuitry, thereby allowing VDDS to be less than VDDMC (in variousembodiments, up to 0.35V less; in other embodiments, VDDS is more than0.35V lower than VDDMC) in order to maximize the efficiency of theperipheral circuitry and minimize power and/or current consumptiontherein. For low leakage requirements, the multiple power supply memory100 can minimize the memory/peripheral circuitry interface currentleakage by disconnecting the peripheral power supply terminal VDDS(e.g., by connecting VDDS terminal 101 to a system voltage island thatcan be switched off or powered off), while the VDDMC terminal 102 forthe memory array power supply remains connected to the second powersupply. Furthermore, current leakage in the memory array can beminimized, while retaining data in the memory array, by externallycontrolling the power supplied to the VDDS terminal 101 and/or the VDDMCterminal 102, by controlling the memory array ground plane (e.g.,through the VSSM terminal 106), or by internally reducing the memoryarray supply voltage at the VDDMC terminal 102.

In some embodiments, the memory 100 operates using a single powersupply. An external power supply can therefore connect to both the VDDSand VDDMC terminals 101 and 102, respectively. However, the single powersupply embodiments generally cannot be completely powered off when thememory array comprises volatile memory cells (e.g., static RAM), anddata retention is required. However, the single power supply embodimentscan reduce the memory array operating voltage and the power consumed bythe memory 100 by partially powering down certain internal circuitry inthe memory 100.

In alternative embodiments, the memory 100 may have three or more powersupplies (e.g., if logic circuitry in the peripheral region isconfigured to operate at more than one voltage). For example, inputsignal-receiving circuitry, such as an input buffer or register, canoperate at one voltage, and other peripheral circuitry, such as a logicgate or address decoder, can be configured to operate at a differentvoltage. In such embodiments, additional voltage translation circuitryis used to convert the voltage of signals in one peripheral power domainto a voltage in the other peripheral power domain.

The VDDS terminal 101 receives a first voltage (e.g., VDD) that providespower for peripheral (e.g., control and input/output [I/O]) circuits inthe peripheral region of the memory 100, and the VDDMC terminal 102receives a second voltage (e.g., VDDMC) that provides power to thememory array. In general, the voltage at the VDDS terminal 101 isapplied at the same time as or after the voltage is applied to the VDDMCterminal 102 (e.g., by closing switch 152 in FIG. 4, after apower-on-reset circuit receiving the voltage applied to the VDDMCterminal 102 generates an active output signal). The VSS terminal 107receives a ground supply for the peripheral circuitry (and, in oneembodiment, for the entire memory 100). The VSSM terminal 106 receives asignal controlling or implementing one or more leakage reduction modes(as described herein), which allows users to optimally bias the memoryarray voltage to minimize current leakage. In some embodiments, thesignal at the VSSM terminal 106 controls a ground plane for the memoryarray. When leakage reduction in the memory 100 is not desired, the VSSMterminal 106 may be left unconnected.

The RCLK and WCLK terminals 108 and 109 receive a read clock and a writeclock, respectively. The NRE and NWE terminals 110 and 111 receive readenable and write enable signals, respectively. In one embodiment, theread enable and write enable signals have an active low digital logicstate. The multi-bit RA[c:0] terminal 112 receives a read address (inwhich RA[0] is the least significant bit [LSB] of the read address), andthe multi-bit WA[c:0] terminal 113 receives a write address (in whichWA[0] is the LSB of the write address), where c is an integer of atleast 2 (e.g., 2^(x)+2^(y), where x and y are each independently aninteger of at least 1, such as 2, 3, 4, 5, etc.). In variousembodiments, the read address and write address may each individuallycomprise a row address, a column address, and in some embodiments, ablock address, each of which may be single- or multi-bit. In embodimentswhere RA[c:0] and WA[c:0] comprise a block address, c can be2^(x)+2^(y)+2^(k), where k is 0 or an integer of at least 1, (e.g., 2,3, 4, etc.). In one embodiment, the row address is assigned to the mostsignificant bits, and the column address is assigned to the leastsignificant bits. The DIN[n:0] and DOUT[n:0] terminals 114 and 115 aredata input and data output terminals, respectively, where DIN[0] andDOUT[0] are each the least significant bit (LSB) of the data, and n isan integer of at least 2 (e.g., 2^(z), where z is an integer of at least1, such as 2, 3, 4, 5, etc.).

The multi-bit RTC[q:0] and WTC[q:0] terminals 116 and 117 receive readtiming and input write timing control signals, respectively, where q isan integer of at least 1. In an alternative embodiment, the RTC and WTCterminals 116 and 117 receive single-bit read timing and input writetiming control signals, respectively (i.e., where q is 0). The RTC[q:0]and WTC[q:0] terminals 116 and 117 are not necessarily hardwired, butthe corresponding read timing and input write timing control signals canbe stored in a register (e.g., in the peripheral region of the memory100) and be modified in accordance with firmware, software, or directexternal control. The control signals received at the RTC and WTCterminals 116 and 117 (e.g., from memory controller 170 in FIG. 4) canoptimize yield and performance, especially in a dual supply memorysystem such as system 200 in FIG. 4. In some embodiments, the RTC[q:0]signal settings can control access time and minimum cycle time limitsfor read operations, and the WTC[q:0] signal settings can controlminimum cycle time limits for write operations. For example, in areduced performance mode of operation at less than nominal power (e.g.,VDD −10%), relatively low RTC[q:0] and WTC[q:0] values can be used.Utilizing a low RTC[q:0] value increases access time and the minimumcycle time limit for read operations, and may provide greater internaltiming margins to cover unanticipated VDD voltage drops. A low WTC[q:0]value also increases the minimum cycle time limit and may also providegreater internal timing margins to cover unanticipated VDD voltage dropsfor write operations. On the other hand, in some embodiments, increasingthe RTC[q:0] and/or WTC[q:0] values when VDDS is lower than VDDMC maydecrease the access time and/or cycle time so that memory performancedoes not decrease proportionally to the system supply voltage, even atlow system supply voltages. In one embodiment, the RTC[q:0] and/orWTC[q:0] values can be taken from either (i) one or more registers (notshown) or (ii) one or more non-volatile storage elements (not shown). Insuch an embodiment, the values in the non-volatile storage element(s)may be determined according to process characteristics of the memoryunder certain operating conditions during testing, while the values inthe register(s) (which can be reloaded as needed and/or desired) can bedetermined during field operating conditions. The read timing and writetiming control signals can be selected from the stored RTC[q:0] and/orWTC[q:0] values using a multiplexer (not shown).

In one embodiment, the memory 100 writes the data at the DIN[n:0]terminal 114 when the NWE terminal 111 is active (e.g., in a low logicstate, or a binary “0”), and reads data to the DOUT[n:0] terminal 115when the NRE terminal 110 is active (e.g., in a low logic state). Thedata at the DIN[n:0] terminal 114 are written to an address identifiedby write address information at the WA[c:0] terminal 113, and the dataDOUT is read from an address identified by read address information atthe RA[c:0] terminal 112.

The memory 100 can perform simultaneous read and write operations whenthe read and write enable signals at the NRE and NWE terminals 110 and111 are both active (e.g., in a low logic state). In the simultaneousread and write state, data is read from the address identified by theinformation at the RA[c:0] terminal 112 and provided at the DOUT[n:0]terminal 115, and data at the DIN[n:0] terminal 114 is written to theaddress identified by the information at the WA[c:0] terminal 113. Whendata is simultaneously written to and read from the same address, thememory array is generally configured to write data at the DIN[n:0]terminal 114 successfully, regardless of the read/write enable signaltiming.

The PDWN terminal 103 receives a control signal that, when active,places the memory in a first reduced power consumption mode. Inembodiments comprising dual power supplies (e.g., the embodiment of FIG.4), assertion of an active PDWN signal allows power at the VDDS terminal101 to be switched off in the periphery of the memory 100 (e.g., bydisconnecting switch 152 in FIG. 4), while memory data is retained inthe array region. When the voltage in the periphery (e.g., VDD) is equalto the voltage in the array (e.g., VDDMC), asserting the PDWN signal mayalso disconnect switch 132 in translation region 130 in FIG. 4.Otherwise, switch 132 (which is configured to connect the peripheralpower rail 125 to the memory array power rail 145) is generally leftopen. Referring back to FIG. 2, the signal applied to the PDWN terminal103 may be driven by the VDDMC voltage. The PDLVMC and PDFVSSM inputterminals 104 and 105 receive respective low-voltage memory and“floating memory ground” control signals that select various leakagereduction modes of operation, as discussed herein. The PDLVMC andPDFVSSM control signals may also be driven by the memory array voltage(e.g., VDDMC).

More specifically, when the memory 100 is in operational mode (when thepower-down signal at the PDWN terminal 103 is inactive), the impedanceof switch 132 is determined by the state of the signals at the PDLVMCterminal 104 and/or PDFVSSM terminal 105. If either signal at the PDLVMCterminal 104 or PDFVSSM terminal 105 is active (e.g., in a high logicstate, or a binary “1,” as shown at 204 a in FIG. 3), the switch 132 isin high impedance mode; otherwise, the switch 132 is in low impedancestate. The memory 100 may enter a first power-down (or standby) modewhen the power-down signal at the PDWN terminal 103 is active (e.g., ina high logic state, or a binary “1,” as shown at 203 in FIG. 3), and theread/write enable signals at the NRE and NWE terminals 110 and 111 areinactive (e.g., in a high logic state or a binary “1,” as shown at 207in FIG. 3). In the first power-down mode, switch 132 is always highimpedance, regardless of PDLVMC or PDFVSSM polarity (i.e., the states ofthe signals at the PDLVMC and PDFVSSM terminals 104 and 105). Theconduction state of switch 132 is also independent of VDDS and VDDMCvalues. In addition, in one embodiment of the first power down mode,when the power-down signal at the PDWN terminal 103 is active, andregardless of the states of the signals at the PDLVMC and PDFVSSMterminals 104 and 105, the memory row decoders are switched off using aninternal switch (e.g., switch 326 in FIG. 7, described below), thewordlines (e.g., WL[0] in FIG. 7) are grounded, the array bitlineprecharge devices (e.g., transistors 412 and 414 in FIG. 7) are turnedoff, and the bitlines (e.g., 410 and 415 in FIG. 7) are isolated fromthe peripheral circuitry 120 (see, e.g., FIG. 5) in the memory 100.

Referring back to FIG. 2, additional power down modes are determined bythe states of the signals at the PDLVMC and PDFVSSM terminals 104 and105. Thus, the memory power reduction scheme disclosed herein can havemultiple levels, where the level (or particular mode) of power reductionis determined by the states of the signals at the PDLVMC and PDFVSSMterminals 104 and 105 and/or the voltage conditions at the VDDS, VDDMCand VSSM terminals 101, 102 and 106. For example, as shown at 204 a and205 b, certain additional power down levels (e.g., “leakage reduction”modes) may be entered when at least one of the control signals at thePDLVMC and PDFVSSM terminals 104 and 105 is active. However, as shown at204 b and 205 a in FIG. 3, the memory 100 enters into a leakagereduction mode that is controlled by either of the signals at the PDLVMCand PDFVSSM terminals 104 and 105.

In various embodiments, the signal at the PDWN terminal 103 remainsasserted (e.g., is in a high logic state, as shown at 203 in FIG. 3)during any of the power reduction or leakage reduction modes. In variousembodiments, the read/write enable signals at the NRE and NWE terminals110 and 111 (FIG. 2) are deasserted (e.g., held in a high logic state,as shown at 207 in FIG. 3) for a predetermined period of time Tdspdprior to entering the power down or leakage reduction modes. Thepredetermined period of time Tdspd can vary, according to design andconfiguration of the memory, and can be, for example, at least one clockcycle, and in one embodiment, at least two clock cycles, as shown at 209in the RCLK and/or WCLK waveform. However, in some implementations, aclock signal is not required for determining the period of time Tdspd.

A period of time Tpdvd after the predetermined period of time Tdspd, theeffect(s) of the power-down or leakage reduction mode(s) may manifest,depending on the power-down or leakage reduction mode entered. In oneembodiment, the period of time Tpdvd is a characteristic delayassociated with certain switches in the memory 100. For example, asshown at 201 in FIG. 3, after entering the power-down mode, the voltageapplied to the VDDS terminal 101 of the memory 100 (see FIG. 2) can bedisconnected, resulting in a decrease of the voltage on the peripheralpower rail to about 0V. As shown at 217 in FIG. 3, all other inputs tothe memory array except PDWN, PDFVSSM and PDLVMC can be independentlythree-stated or held in a high-impedance state after the voltage to theVDDS terminal 101 (FIG. 2) is disconnected. At 202 in FIG. 3, duringpower-down, the voltage applied to the VDDMC terminal 102 of the memory100 (FIG. 2) can be reduced by a predetermined amount as describedherein, and as shown at 206 in FIG. 3, the voltage on the ground planeof the memory array can increase by a predetermined amount, as describedherein. Additionally, during power-down, internal read and write clocksignals (e.g., generated from timing signals received at the RCLK andWCLK terminals 108 and 109) can be kept running or can be held at a highor low logic state (see, e.g., 208 in FIG. 3).

During a first power-down/leakage reduction mode (e.g., in which thesignal at the PDWN terminal 103 is asserted, but not the signals at thePDLVMC and PDFVSSM terminals 104 and 105), peripheral circuits in theperipheral region of the memory 100 are at least partially powered down.If no other action is taken, the memory interface is still active. Thus,the other inputs (see, e.g., 216 in FIG. 3) to memory 100 should remaindefined (e.g., driven and/or operational). When the memory 100 ispowered using dual power supplies (e.g., one power supply connected tothe VDDMC terminal 102, and another power supply connected to the VDDSterminal 101), standby leakage can be further reduced by eitherdisconnecting or grounding the voltage at the VDDS terminal 101 (e.g.,when data at the DOUT terminal 115 is not driven), and/or reducing thevoltage (e.g., VDDMC) on the memory array power rail to the minimum dataretention voltage. Disconnecting or grounding the voltage at the VDDSterminal 101 and reducing the memory array voltage (VDDMC) furtherreduces leakage. When the voltage at the VDDS terminal 101 is groundedor disconnected, the memory inputs (e.g., DIN, RA[c:0], WA[c:0], RCLK,WCLK, etc.) other than PDWN, PDLVMC, and PDFVSSM can be undefined, andthe memory outputs (e.g., the data at the DOUT terminal 115) areundefined.

During a second power-down/leakage reduction mode (e.g., in which thesignals at the PDWN and PDLVMC terminals 103 and 104 are asserted), thememory peripheral circuits are at least partially powered down, and theinternal memory array ground voltage is raised to VSS+Vtn, where Vtn isa threshold voltage of a diode (e.g., a P-N type diode) or a diode-wiredn-channel transistor. The NRE and NWE terminals 110 and 111 aredeasserted (e.g., at a high logic state; see 207 in FIG. 3), and thedata provided at the DOUT terminal 115 is the last data read from memory100. If no other action is taken, the memory interface is still active.Thus, the memory inputs should remain defined (e.g., driven and/oroperational; see 216 in FIG. 3). In the second power-down/leakagereduction mode, the voltage on the memory power rail (VDDMC) is notreduced (see, e.g., 206 in FIG. 3). Power at the VDDS terminal 101,however, can be disconnected or grounded (e.g., at 201 in FIG. 3) whenthe memory 100 has two different power supplies. As for the firstpower-down/leakage reduction mode, when the voltage at the VDDS terminal101 is grounded or disconnected, the memory inputs other than those atthe PDWN, PDLVMC, and PDFVSSM terminals 103, 104 and 105 can remainundefined (see, e.g., 217 in FIG. 3), and the memory outputs at the DOUTterminal 115 are undefined.

During a third power-down/leakage reduction mode (e.g., in which thesignals at the PDWN and PDFVSSM terminals 103 and 105 are asserted), asfor the first and second power-down/leakage reduction modes, the NRE andNWE terminals 110 and 111 are deasserted, and the data provided at theDOUT terminal 115 is the last data read from the memory 100. However,power at the VDDS terminal 101 can be disconnected when the dataprovided at the DOUT terminal 115 is not driven. The voltage at the VSSMterminal (providing a ground potential in the memory array of the memory100) can be driven externally, to a voltage optimal for retention ofdata in the memory array (see, e.g., 206 in FIG. 3). The voltage on thememory array power rail (VDDMC) can also be reduced (e.g., at 202 inFIG. 3) to improve current leakage reduction, as long as the voltagedifferential VDDMC−VSSM remains within operational limits of the memoryarray.

During the third power-down/leakage reduction mode, the peripheralcircuits in the memory 100 are at least partially powered down, and thememory array ground supply can be “floated” (e.g., electricallydisconnected from an external ground potential) to allow application ofa positive source bias voltage to the VSSM terminal 106 (FIG. 2) tofurther reduce leakage. Thus, the VSSM terminal 106 may be tristatedduring the operational mode (e.g., in which typical read and writeoperations are conducted), and driven externally during the thirdpower-down/leakage reduction mode. As for the first and secondpower-down/leakage reduction modes, when no other action is taken, thememory interface remains active and, therefore, memory inputs other thanthose at the PDWN, PDLVMC, and PDFVSSM terminals 103, 104 and 105 shouldremain defined (e.g., driven and/or operational; see, e.g., 216 in FIG.3). To further reduce leakage, VDDMC can be reduced (e.g., at 202 inFIG. 3), and VSSM can be increased to a voltage (e.g., at 206) thatenables data to be retained in the memory array. Furthermore, and as inthe first and second power-down/leakage reduction modes, power at theVDDS terminal 101 (FIG. 2) can be disconnected or grounded to reduceleakage when the memory 101 has dual power supplies. When power at theVDDS terminal 101 is grounded or disconnected, memory inputs other thanthose at the PDWN, PDLVMC, PDFVSSM terminals 103, 104 and 105 (see,e.g., 217 in FIG. 3) can remain undefined, and the memory outputs at theDOUT terminal 115 are undefined.

The memory 100 can be powered back up when the signal at the PDWNterminal 103 is active. Prior to exiting a power down or leakagereduction mode, and as shown in part at 218 in FIG. 3, substantially allmemory input signals are driven to a predefined logic level. Entering orexiting a power-down or leakage reduction mode without driving thememory input signals to a predefined logic level may result in dataloss. In one embodiment, the memory input signals are driven to apredefined logic level for at least a predetermined period of time Tdvcbefore powering up the power rail(s) to their full voltage levels. Thepredetermined period of time Tdvc can be, for example, at least 1 ns or2 ns, but the invention is not limited to these values.

Before exiting any of the power-down or leakage reduction modes, thevoltages VDDS and (if applicable) VDDMC, applied respectively to theperipheral circuitry and the memory array of the memory 100, arerestored to their full levels, and the memory array ground potentialVSSM is restored to its predetermined level in operational mode (e.g.,0V). These power rails are restored a predetermined period of time Tvspuprior to any deassertion of the power-down/leakage reduction signals atthe PDWN, PDLVMC, and PDFVSSM terminals 103, 104 and 105. In variousembodiments, the predetermined period of time Tvspu can be as small as 0ns, but it can be 1 ns, 2 ns, or 5 ns, but the invention is not limitedto any of these values. To exit the power-down and/or leakage reductionmode, the signal at the PDWN terminal 103 is deasserted (e.g., ittransitions to a low logic state at 223 in FIG. 3) along with anyasserted leakage reduction signal at the PDLVMC or PDFVSSM terminals 104or 105, respectively, for a period of time Tpdce before the memory 100can be accessed. In various embodiments, the minimum length of timeTceva between deassertion of the power-down/leakage reduction signalsand a read or write operation to the memory 100 can be, e.g., 5 ns, 10ns, 20 ns, or any other value enabling reliable read and writeoperations to the memory 100. As illustrated in FIG. 3, a predeterminednumber (e.g., two) read clock cycles 219 are executed during the timeTceva, prior to assertion of a read/write enable signal NRE/NWE.However, the read/write clock(s) RCLK/WCLK may be kept in a low logicstate prior to the read clock cycles 219.

Dual Power Supply Memory with Low Voltage and Power-Down Operations

FIG. 4 shows a dual-power supply memory system 200 suitable for lowvoltage and power saving operations. The dual supply system 200 (e.g.,comprising memory 100, memory controller 170, and power supplies 150 and160) can be used to reduce the system power consumption for typicaloperations (e.g., beyond foundry specifications) and in power-down mode,to reduce leakage current, or both. In some embodiments, one powersupply 160 is dedicated as a memory array power supply, while the otherpower supply 150 supplies other circuitry (e.g., peripheral circuitry120) with power. In a power-down mode, the peripheral power supply 150can be switched off, using switch 152, while the memory array supplyvoltage provided by power supply 160 can be maintained at a levelsufficient for data retention.

In some embodiments, one or both of power supplies 150 and 160 arevariable. For example, in one embodiment, the first power supply 150 isa variable power supply, and the second power supply 160 provides afixed voltage. The first power supply 150 provides a first voltage(e.g., VDD) to memory controller 170 and, via switch 152, to theperipheral circuitry 120 of memory 100. When switch 152 is closed,peripheral circuitry 120 receives the first voltage from power supply150. In various embodiments, memory controller 170 provides a pluralityof control and/or timing signals (e.g., in FIG. 2, power-down symbolsPDWN, PDLVMC and PDFVSSM, and at least one pair of the signals NRE andNWE, RA[c:0] and WA[c:0], RTC and WTC, and/or RCLK and WCLK) to memory100 to control the operation(s) of the memory chip.

When operating the memory 100 with dual power supplies 150 and 160, theperipheral voltage VDD is generally not greater than the memory arrayvoltage VDDMC.

The memory array 140 can be operated, for example, at a voltage or powersupply of 0.90V (±10%) at junction temperatures from −40 to 125° C. Theperipheral circuitry 120 can be fully static. In embodiments employing asingle voltage (e.g., where the voltage provided by the power supply 150is equal to or substantially equal to the voltage provided by the powersupply 160), considerations relating to the voltage VDDMC can beeliminated. For example, switch 132 can be closed, thereby providing asingle voltage (e.g., VCC) to both the peripheral circuitry 120 and thememory array 140. Since the memory interface circuits in peripheralcircuitry 120 are supplied by the peripheral power rail 125, which canbe connected via switch 152 to the power supply 150, level-shiftingcircuits at the memory array interface in the translation circuitry 130are not required when the voltage VDD is not below VDDMC minus athreshold voltage (e.g., in one embodiment, the threshold voltage isabout 0.35V).

In one embodiment (e.g., in the read/write operational mode), switch 152is closed and peripheral circuitry 120 receives the first voltage (e.g.,VDD) on peripheral power rail 125. Peripheral circuitry 120 providessignals at the first voltage to translation circuitry 130. When thevoltage provided by the power supply 150 is substantially different fromthe voltage provided by the power supply 160, switch 132 remains openwhen switch 152 is closed. The second power supply 160 provides a secondvoltage (e.g., VDDMC) to a memory supply rail 145, which is configuredto provide power to memory array 140. Generally, the voltage provided bythe second power supply 160 is greater than that provided by the firstpower supply 150 (e.g., VDDMC>VDD), but not necessarily so.

To reduce or minimize power consumption, it is often desirable to reducethe voltage supplied to peripheral circuitry 120 of the memory 100, aswell as the voltage of the memory array 140 to the minimum operationalvoltage to retain data in the memory array. When the system 200 isplaced in a power-down mode, the switch 152 is opened. In oneembodiment, assertion of a power-down control signal at a PDWN terminal(e.g., terminal 103 in FIG. 2) opens the switch 152. During thispower-down mode, when switch 152 is opened, the voltage VDD applied tothe peripheral circuitry 120 of memory 100 can be deactivated (e.g., byopening switch 152), and thus both switch 152 and switch 132 are open.As a result, the peripheral circuitry 120, and at least a part oftranslation circuitry 130, do not consume power. Additionally, and asdescribed herein, the voltage output by power supply 160 can bedecreased to a minimum voltage for the memory array 140 to retain data,to further reduce standby power consumption and/or leakage.

FIG. 5 shows a block diagram 200 of circuitry suitable for memory 100 inFIGS. 2 and 4, comprising peripheral circuitry 120, translationcircuitry 130, and a memory array 140. The peripheral circuitry 120comprises an address decoder 210, precharge circuits 251, 252 and 253,column selection circuits 256, 257 and 258, and sense circuitry 260. Thetranslation circuitry 130 comprises translation circuits 220, 230 and240. The memory array 140 comprises word lines WL[0], WL[1], . . . WL[N]and memory cells 221, 222, . . . 228, 231, 232, . . . 238, . . . 241,242, . . . 248. For clarity, the memory array power supply VDDMC isshown as being provided to memory cells 221, 222, . . . 228, but infact, the memory array power supply VDDMC is provided to all of thememory cells in the memory array 140, including the memory cells 231,232, . . . 238 and 241, 242, . . . 248.

Specifically, an address decoder 210 operating at voltage VDDS (e.g., asreceived from a voltage source similar to that of power supply 150 inFIG. 3) receives address information (e.g., RA[c:0]) configured todetermine the address in the memory array 140 for a read or writeoperation. Generally, the address information comprises a row addressand a column address. In some embodiments, the address informationfurther comprises a block or group address. The address decoder 210outputs a word line selection signal 212 to the translation circuitry130 and a column select signal 214 to the column selection circuits 256,257 and 258. In the high digital logic state, the word line selectionsignal 212 and the column select signal 214 have a voltage VDDS. In oneembodiment, the word line selection signal 212 is single-bit, butalternatively, it may be a multi-bit signal (e.g., in which each bitcorresponds to a unique row or word line of the memory array 140). Inaddition, the column select signal 214 may be a single-bit signal thatselects all columns in the array, or a multi-bit signal that selects oneor more columns in the array, in which each bit corresponds to a uniquecolumn or pair of bit lines in the memory array 140.

In various embodiments, the address decoder 210 can comprise separaterow address and column address decoders, respectively configured toprovide a word line selection signal 212 and column select signal 214.In some embodiments, the address decoder 210 can further comprise aseparate block or group address decoder configured to select one arrayof a plurality of arrays for a read or write operation, oralternatively, a separate block or group address decoder (not shown) canselect the memory array 140 for a read or write operation. Thus, thememory 100 can comprise more than one memory array 140.

The translation circuits 220, 230 and 240 each comprise one or morelogic gates receiving the word line selection signal 212, a memory arraypower supply VDDMC, and an enable signal (e.g., translation circuit 220receives enable signal EN0), and provide a word line activation signal(e.g., translation circuit 220 provides word line activation signalWL[0]). In one embodiment, the enable signals EN0, EN1, . . . EN[N]comprise a block address signal. In alternative embodiments, the enablesignals EN0, EN1, . . . EN[N] comprise a block enable signal or a wordline enable signal. In the high digital logic state, the word lineactivation signals WL[0], WL[1] . . . WL[N] have the voltage VDDMC. Theword line selection signal 212, in conjunction with the enable signals(e.g., EN0, EN1, etc.), is configured to select one or more of theidentified memory cells (e.g., 221, 222, or 228) in the memory array 140for a read or write operation. The memory cells 221, 222, . . . 228,231, 232, . . . 238, . . . 241, 242, . . . 248 can comprise or consistessentially of eight-transistor memory array cells, although other celldesigns (e.g., a six transistor cell, a four transistor—two resistorcell, a two transistor-two capacitor [differential] cell, a onetransistor-one capacitor cell, etc.) are also applicable.

As discussed above, each of the memory cells 221, 222, . . . 228, 231,232, . . . 238, . . . 241, 242, . . . 248 are coupled to the memoryarray voltage source VDDMC. Each column of the memory cells is coupledto a precharge (P/C) circuit 251, 252, 253, configured to precharge thebit lines in the column of the memory cells (e.g., cells 221, 231, . . .241) to a voltage different than that of the memory array 140 (e.g., thevoltage VDDS applied to the peripheral circuitry 120) in response to aprecharge control signal, prior to a read or write operation. Each ofthe column selection circuits 256, 257, . . . 258 is configured to passthe differential signal on the bit lines of the corresponding column toa sense amplifier 260, configured to detect the differential voltageacross the bit lines in the selected column and convert the detecteddifferential voltage to a bit value (e.g., a “1” or “0”).

FIG. 6A illustrates the translation circuit 220 in FIG. 5 in moredetail. Specifically, translation circuit 220, which comprises aswitch/selector 310 and a buffer 344, is configured to provide a voltageshift at the memory array interface between peripheral circuitry 120 andmemory array 140. The switch/selector 310 receives the memory arrayvoltage (e.g., VDDMC) and the output 212 from address decoder 210 inFIG. 5. Switch/selector 310 is also configured to receive an enablesignal 341 (e.g., a write latch enable signal WLEN), configured toselect a group or block of memory cells (e.g., memory array 140 in FIG.5 or a group or block of cells within the memory array 140) for a reador write operation. Alternatively, the enable signal 341 can be a wordline enable signal, which may be part of the address information for aread/write operation, or an output from a row address decoder. Ineffect, the enable signal 341 selects one of the decoder output 212 orthe memory array voltage VDDMC to output at node 343 and provide tobuffer 344, which operates at the memory array voltage (e.g., VDDMC).Buffer 344 receives the selected signal at node 343 (which, when thedecoder output 212 is selected, is at the first voltage VDD when thedecoder output 212 has a high logic state) and provides a word linesignal 345 to the memory array (not shown) at the memory array voltageVDDMC when word line signal 345 has a high logic state. Theswitch/selector 310 is configured to introduce minimal or no latencyinto the signal path from the decoder output 212 to the memory array,and the buffer 344 is configured to introduce less latency into thesignal path from the decoder output 212 to the memory array than aconventional two-stage level-shifting circuit.

FIG. 6B shows the translation circuit 220 of FIG. 6A in even furtherdetail. In the embodiment of FIG. 6B, the translation circuit 220comprises the switch/selector 310, the buffer 344, a power-down switch326, and a capacitor 330. In various embodiments, the switch/selector310 is configured as a two-input multiplexer, and the buffer 344 is aninverter configured to drive a signal on the wordline WL[0] (i.e., awordline driver). The capacitor 330 is coupled between the output node343 of switch/selector circuit 310 and ground, and is configured tostore a predetermined amount of charge on output node 343. As shown inFIG. 6B, the power-down switch 326 between buffer 344 and VDDMC,comprising a PMOS transistor with a gate controlled by the PDWN signal(e.g., the signal at the PDWN terminal 103 in FIG. 2). Switch 326 shutsoff wordline drivers to reduce leakage when the PDWN signal is active.

Specifically, the switch/selector 310 comprises an n-channel transistor312 and a p-channel transistor 314. N-channel transistor 312 receivesthe decoder output 212 at a first source/drain terminal, and the sourceterminal of p-channel transistor 314 is coupled to the memory arraysupply voltage (VDDMC). The decoder output 212 can have either a lowlogic state (e.g., 0V) or a high logic state (at the peripheralcircuitry power rail VDDS). The enable signal 341 (WLEN[0],corresponding to enable signal EN0 in FIG. 4) is applied to the gate ofboth N-channel transistor 312 and p-channel transistor 314. Depending onthe state of the enable signal 341, either VDDMC (enable signal low) orthe decoder output 212 (enable signal high) is output at node 223.

Buffer 344 comprises p-channel transistor 322 and n-channel transistor324, configured as a CMOS inverter. The source terminal of p-channeltransistor 322 is coupled to the memory array supply voltage (VDDMC),and the drain terminal of n-channel transistor 324 is coupled to aground potential (e.g., the system ground potential applied to theperipheral circuitry 120 in FIGS. 4 and 5). The output 325 of the buffer344 (FIG. 6B) at a common source/drain terminal between transistors 322and 324 is a word line signal (e.g., WL[0]), provided to the memoryarray (e.g., memory array 140 in FIGS. 4 and 5). Thus, the word linesignal 325 is at either 0V (when selector 310 selects VDDMC or thedecoder output 212 at a high logic state [VDDS]) or VDDMC (when thedecoder output 212 is selected and it has a low logic state). Thus, theword line signal 325 is driven by either ground or the memory arrayvoltage VDDMC, according to the state of the decoder output 212.

In various embodiments, switch 326 can be coupled between VDDMC andmultiple wordline buffers 344. The source of the switch 326 is connectedto VDDMC, and the drain node of the switch 326 can be coupled to a groupof buffers 344. The output (i.e., the signal at the drain node) of theswitch 326 can be termed VDDXD. In one embodiment, the size (e.g.,width) of switch 326 is substantially less than sum of the widths of thep-channel transistors 322 coupled to the switch 326, but issubstantially more the than the width of a single p-channel transistor322. Alternatively, multiple switches 326 can be coupled between VDDMCand the multiple wordline buffers 344 configured to select the rows of amemory array (see, e.g., translation circuits 220, 230, and 240 in FIG.5). For example, a single switch 326 can be coupled between VDDMC and asingle buffer 344, as shown in FIG. 6B. The well connection oftransistors 314 and 322 is to VDDMC.

In operational mode, all decoder outputs 212 (except for a decoderoutput that selects and/or activates a wordline) are generally driven atthe peripheral supply VDDS. However, in the case of a decoder output 212that selects and/or activates a wordline, the circuitry in theswitch/selector circuit 310 may have potential leakage paths and/or afailure mechanism. Specifically, when the decoder output 212 is drivento 0 V, and the voltage VDDMC supplied by the memory array power rail isgreater than (i) the voltage of the enable signal 341 at a high logicstate plus (ii) the threshold voltage of the p-channel transistor 314 inthe switch/selector circuit 310, a high enable signal 341 may not beable to turn off the p-channel transistor 314, and current from thememory array power rail can leak onto the switch/selector circuit outputat 343 and/or the decoder output node 212. Thus, even when the memoryarray voltage VDDMC is greater than the peripheral voltage VDDS plus thethreshold of the p-channel transistor 314, there will be very littleleakage through the n-channel transistor 312 for the decoder outputs 212that that do not select or activate a wordline. However, precautions canbe taken to prevent current leakage through the p-channel transistor314. For example, devices in the translation circuitry 220 can be sizedto prevent current leakage to the decoder output 212 when the voltageVDDMC supplied by the memory array power rail is greater than thevoltage (VDDS) on the enable line 341 plus the threshold voltage of thep-channel transistor 314.

In a typical embodiment, a default condition is that all wordlines(e.g., WL[0] through WL[N] in FIG. 5) are low. One wordline is high(e.g., has a high logic state) only for a transient time during a reador write operation. Thus, when the enable signal 341 is in a high logicstate (at the peripheral power rail VDDS), transistor 312 passes thedecoder output 212 to the output 343 of the switch/selector 310, andwhen the decoder output 212 is low, a low logic state (e.g., 0V) isideally maintained at 343, and the buffer 344 ideally provides word linesignal 325 with a high logic state (VDDMC).

In the case where VDDMC exceeds VDDS plus the threshold voltage (V_(T))of p-channel transistor 314, when the decoder output 212 is low and theenable signal 341 is high, current can leak from the memory array powerrail onto switch/selector output node 343, thereby raising the voltageat 343, and possibly affecting the voltage on the word line signal 325.More specifically, when the gate-to-source voltage difference (Vgs) atthe p-channel transistor 314 is sufficiently high to cause currentconduction through the p-channel transistor 314 (and, since the enablesignal 341 is high, through n-channel transistor 312), a would-be highwordline 345 may start going low if enough current leaks onto theswitch/selector output node 343 to cause the voltage at theswitch/selector output node 343 to rise to about the threshold ofn-channel transistor 324 in buffer 344. However, the effect of anyleakage across p-channel transistor 314 can be negated by the size ofp-channel transistor 314 and, in one embodiment, the size of re-channeltransistor 312. P-channel transistor 314 is therefore sizedappropriately to prevent inadvertent turn-on when VDDMC exceeds VDDSplus the V_(T) of p-channel transistor 314. For example, p-channeltransistor 314 can have a width effective to prevent inadvertent turn-onof p-channel transistor 314 when VDDMC exceeds VDDS+V_(T). In a furtherembodiment, p-channel transistor 314 and n-channel transistor 312 can besized such that only a substantially large difference between VDDMC andVDDS (e.g., VDDMC−VDDS>>V_(T) of the p-channel transistor 314) can turnon the p-channel transistor 314 and/or cause sufficient chargeaccumulation on the switch/selector output node 343 to reduce a voltageon the corresponding wordline 345. In fact, the ratio of VDDMC to VDDS(or to VDDS+V_(T) of the p-channel transistor 314) has a maximum thatcan be determined by the ratio of the size (e.g., length) of thep-channel transistor 314 to the size (e.g., length) of the n-channeltransistor 312. In addition, current leakage onto switch/selector outputnode 343 can be stored on capacitor 330, thereby reducing any effect ofleakage through p-channel transistor 314.

FIG. 7 illustrates in more detail a portion 400 of the peripheralcircuitry for read and/or write operations in the memory 200 in FIG. 5,comprising precharge (P/C) circuit 251, column select circuit 256, andsense circuit 261. Specifically, precharge circuitry 251 is coupledbetween a column of memory cells (e.g., 221, 231, and 241 in FIG. 5) inmemory array 140 and sense circuit 261 (see FIG. 7). The prechargecircuit 251 generally comprises p-channel transistors 412 and 414 (butis not limited to p-channel transistors or the configuration disclosedin FIG. 7), and precharges the bit lines 410 and 415 to the voltage VDDon the peripheral power rail, in response to an active precharge signalPRE at node 430. The column select circuit 256 generally comprisesp-channel transistors 445 and 455 (but is not limited to p-channeltransistors or the configuration disclosed in FIG. 7), and selects thecolumn corresponding to bit lines 410 and 415 for a read operation atnode 214. Sense circuit 261 generally comprises a conventionaldifferential sense amplifier, and is coupled to the peripheral powerrail VDD.

Although precharge transistors 412 and 414 precharge the bit lines 410and 415 to the voltage VDDS on the peripheral power rail, and the columnselect signal 214 operates at the peripheral voltage VDDS, the fact thatthe memory cells in the memory array may operate at a higher voltage(e.g., when VDDMC>VDDS) does not affect memory performance. Typically,in an architecture such as that shown in FIG. 5, it may be expected toprecharge the bitlines 410 and 415 (FIG. 7) to VDDMC, since the memoryarray receives VDDMC. However, in the present disclosure, the bitlines410 and 415 are precharged to VDDS. This reduces leakage current fromthe VDDMC supply and eliminates any need to have level-translatedsignals driving the gates of the column select devices 445 and 455. Thisalso eliminates the need to connect the NWELL of the column selectdevices 445 and 455 and the sense circuitry 260 to VDDMC, therebyfurther reducing leakage from the VDDMC supply (which is typicallyalways on when data retention is desired). Furthermore, having thebitline voltage lower than the memory supply VDDMC and the activewordline voltage (also at VDDMC) increases the read stability of thememory cells (e.g., 221-248 in FIG. 5). This is an important advantageas memory transistor sizes become smaller, and/or as cell stabilitydecreases. Furthermore, the present circuitry eliminates any need forcircuitry configured to translate a voltage on a bit line to aperipheral voltage during a read operation.

Single Power Supply Memory Architectures with Power-Down Functionality

FIG. 8A illustrates an embodiment 500 of the present memory system,comprising a memory 510 capable of operating in one or more power-downmodes, and equipped with a single power supply 180 providing power toboth peripheral circuitry 120 and a memory array 140. The memory array140 can receive a voltage greater than that provided by power supply 180(in one embodiment, about 0.2V greater than VDDS) from a charge pump520. In such an arrangement, the memory 510 operates at 125° C. whenfabricated on a single-crystal silicon substrate. The memory system 500reduces overall system power consumption by reducing the peripheralsupply voltage (e.g., VDD), while minimally increasing the size of thememory 510 (e.g., by 1-1.5%, depending on [1] the proportion of the areaof memory 510 consumed by the memory array 140, and [2] the area of thecharge pump 520). The power-on time before memory operations can beperformed is minimal, and the proportion of power allocated tooperational states can increase by up to 30%. Furthermore, both theperipheral power rail terminal 101 and the memory array power railterminal 102 can be coupled to the external power supply.

Specifically, memory system 500 utilizes a single voltage source 180(which may be a fixed voltage source as shown or a variable voltagesource) configured to provide a voltage (e.g., VDD) on power line 185 toboth the peripheral circuitry 120 and the memory array 140 of the memory510. Peripheral circuitry 120 receives the supply voltage from powerline 185 via power rail 125. On the other hand, charge pump 510 receivesthe supply voltage from power line 185 and converts the supply voltageto a higher voltage on memory array power rail 145 for memoryoperations. Switch 132, which is coupled between the peripheral powerrail 125 and the memory array power rail 145, is generally kept open.Further power reduction can be realized by implementing a leakagereduction function involving a ground plane in the memory array 140(discussed above with regard to the signals received at the PDLVMC andPDFVSSM terminals 104 and 105 in FIG. 2, and further discussed in moredetail with regard to FIGS. 10A-B).

FIG. 8B illustrates another embodiment of a memory system 550 having asingle power supply 180 and an external power-down switch 152. Asillustrated, memory system 550 utilizes a single voltage source 180(which may be a fixed voltage source as shown or a variable voltagesource) configured to provide a voltage (e.g., VDD) on power line 185 toboth peripheral circuitry 120 (when the switch 152 is closed) and tomemory array 140. Voltage source 180 provides the voltage directly tomemory array power rail 145 of memory array 140, without the charge pump510 of FIG. 8A.

In an operational state (e.g., in which typical read and writeoperations are performed), peripheral power rail 125 (FIG. 8B) isconnected to memory array power rail 145 via switch 132 in the memory560. In an alternative embodiment, the memory array 140 can receive avoltage greater than that provided by power supply 180 if a charge pumpsimilar to or the same as charge pump 520 is provided between memoryarray power rail terminal 102 and memory array power rail 145. However,in such embodiments, the switch 132 connecting peripheral power rail 125and memory array power rail 145 is generally left open.

However, when memory system 550 is in the power-down state, switches 152and 132 are open, and the peripheral power rail 125 is floating. In thesystem 550 of FIG. 8B, switches 132 and 152 may be controlled by thecontrol signal at the PDWN terminal 103 (see FIG. 2). Thus, duringpower-down mode, no voltage is provided to peripheral power rail 125,but the operating voltage remains provided to memory array power rail145. As a result, the peripheral circuitry 120 is in an idle stateduring power-down mode, and memory array 140 can no longer be written toor read from. However, since the voltage (e.g., VDD) is still providedto memory array 140, the memory cells therein still receive a voltagesufficient to maintain the data stored in the memory cells. Furtherpower savings can be realized by implementing the leakage reductionfunctions involving the memory array ground plane (not shown, butdiscussed above with regard to the signals received at the PDLVMC andPDFVSSM terminals 104 and 105 in FIG. 2, and further discussed in moredetail with regard to FIGS. 10A-B).

Memory Architectures with Dual Power Supplies and Power-DownFunctionality

FIG. 9A illustrates an embodiment 600 of the present memory systemcomprising memory 100, a single power supply 150 and a voltage regulator620. As illustrated, the memory system 600 utilizes a variable powersupply 150 configured to provide a first voltage (e.g., VDDMC) to memorycontroller 170, voltage regulator 620, and memory array 140.Alternatively, variable power supply 150 can be replaced with a fixedpower supply (e.g., power supply 180 in FIGS. 8A-B), but variable powersupply 150 enables a power reduction mode in which the voltage providedby the variable power supply 150 to the memory array 140 is reduced to aminimum voltage (or just above the minimum voltage) that enables thememory array 140 to retain data in its memory cells, without performingread and write operations.

Memory controller 170 is configured to provide a plurality of controlsignals on bidirectional bus 175 to the memory 100 as described herein(particularly with regard to FIG. 2), and receive control and/or datasignals from memory 100. In an alternative embodiment, bus 175 isunidirectional (e.g., from the memory controller 170 to the memory 100).Voltage regulator 620 is configured to provide a voltage to theperipheral circuitry 120 that is different from (and in general, lessthan) that provided by power supply 150. Switch 152 is therefore closedwhen the peripheral circuitry 120 is in an operational state.

When the memory 100 is in an operational state, switch 152 is closed,switch 132 is open, voltage regulator 620 and memory array power rail145 receive a voltage VDDMC from the variable power supply 150, andperipheral power rail 125 receives a second voltage (e.g., less thanVDDMC) from the voltage regulator 620. During typical memory read andwrite operations, the peripheral circuitry 120 provides signals havingthe second voltage in the high logic state to translation circuitry 130,and translation circuitry 130 provides signals having the memory arrayvoltage VDDMC to memory array 140.

When the memory system 600 is in a first power-down mode, switch 152 isopen, as discussed herein. During the first power-down mode, no power orvoltage is provided to peripheral circuitry 120, but a voltage (e.g.,VDDMC) is provided to memory controller 170 and to memory array 140 viamemory array power rail 145. Thus, during the first power-down mode,peripheral circuitry 120 remains in an idle state, but memory controller170 remains in an operational state, and the memory array 140 maintainsthe data stored in its memory cells. However, the memory array 140cannot be written to or read from. In a second power-down mode, thevoltage provided by the variable power supply 150 to the memory array140 is reduced to the minimum voltage that enables the memory array 140to retain data in its memory cells, or just above that minimum voltage.The voltage output by variable power supply 150 can be reduced inresponse to a control signal from the memory controller 170 or anexternal controller or processor (not shown).

FIG. 9B illustrates a further embodiment 700 of the present memorysystem comprising first and second power supplies 150 and 160 and aground plane 142 in the memory array 140. As illustrated, memory system700 utilizes a first variable power supply 150 configured to provide afirst voltage (e.g., VDD) to memory controller 170 and peripheralcircuitry 120 via switch 152. Similarly, a second variable power supply160 is configured to provide a second voltage (e.g., VDDMC) to memoryarray power rail 145. Memory controller 170 provides a plurality ofcontrol signals on bus 175 to the memory 710, and may receive one ormore data and/or control signals from the memory 710 on bus 175. Switch152, when closed, provides a voltage (e.g., VDDS) to peripheralcircuitry 120 for typical operations in memory 710 (e.g., reading andwriting data). When in operational mode, peripheral circuitry 120provides signals to translation circuitry 130 at a peripheral voltage(e.g., VDD when the signals are in a high logic state). Duringoperational mode, switch 132 is open when the voltages from powersupplies 150 and 160 are different, but switch 132 is closed when thevoltages from power supplies 150 and 160 are the same (to reducedifferential supply noise from the different power supplies 150 and160).

When the memory 710 enters a power-down mode, switch 152 is opened, asdescribed herein. During the power-down mode, no voltage is provided toperipheral circuitry 120 from power supply 150, but a voltage isprovided to memory controller 170 from power supply 150, and to memoryarray power rail 145 from power supply 160. Additionally, during thepower-down mode, switch 132 is open. Power supply 160 can also bereduced to a minimum voltage sufficient to retain data in the memoryarray 140 (or just above such a minimum voltage) to further reduceleakage. During the power down mode, the translation circuitry 130 maynot provide active signals (e.g., a precharge signal, read or writeaddresses, read enable or write enable) to the memory array 140.However, since memory array power rail 145 provides a voltage to thememory array 140, data stored in the memory cells (e.g., memory cells221 and 222 in FIG. 5) is retained.

Memory Architectures with Memory Array Leakage Reduction Modes

FIG. 10A is a diagram illustrating an embodiment 800 of the presentmemory system comprising a variable power supply 150 (which may be,alternatively, a fixed power supply) and a memory 810 comprisingperipheral circuitry 120 and a memory array 140 having a memory arraypower rail 145 and a ground plane 142 (e.g., coupled to a VSSM terminal106). As illustrated, the memory system 800 utilizes a single powersupply 150 configured to provide a first voltage (e.g., VDDS) to switch152 and to memory array power rail 145. Switch 152, when closed,provides the first voltage VDDS to peripheral circuitry 120 viaperipheral power rail 125. When operational (i.e., when switch 152 isclosed), peripheral circuitry 120 provides signals at the peripheralvoltage (e.g., VDDS when in a high logic state) to memory array 140.When system 800 is in the operational mode, switch 132 may be open orclosed.

When the system 800 enters a power-down mode, switch 152 is opened. Asdiscussed above, the memory 810 can enter a power-down mode uponapplication of an active control signal to the PDWN terminal 103 (seeFIG. 2). The power-down mode also opens switch 132 (if not alreadyopen). During the power-down mode, power from power supply 150 is notprovided to the peripheral circuitry 120, but is provided to the memoryarray 140 via memory array power rail 145. Thus, during the power-downmode, the peripheral circuitry 120 is in an idle state, while the memoryarray 140 operates at a voltage supplied by the power supply 150 (e.g.,VDDMC). As a result, the address and read circuitry (e.g., the addressdecoder 210, the precharge circuitry 251-253, the column selectcircuitry 256-258, and the sense circuitry 260 in FIG. 5) generally doesnot operate. However, the memory cells still operate at a voltagesufficient to retain data stored in the memory cells. In someembodiments, the power supplied by variable power supply 150 can bereduced to an optimum (or minimal) voltage sufficient to retain data inthe memory cells, to further minimize leakage in the memory array 140.

Furthermore, to further reduce leakage, ground plane 142 in the memoryarray 140 is coupled to a diode 820 (in turn coupled to a groundterminal) and a switch 830. Diode 820 can be coupled to the memory arrayground plane 142 when a first leakage reduction control signal 104/106(e.g., PDLVMC or VSSM; see FIG. 2) disconnects switch 830. Diode 820 cancomprise one of a wide variety of diodes, such as Schottky diodes,PN-type diodes, diode-wired transistors, etc., but the invention is notlimited to one of these types of diodes. Coupling the diode 820 to thememory array ground plane 142 raises the voltage on the memory arrayground plane 142 by a threshold voltage of the diode 820, therebyreducing the voltage differential between memory array power rail 145and memory array ground plane 142, and reducing leakage current in thememory array 140. In further embodiments, more than one diode can belinked between the memory array ground plane 142 and the external groundpotential, either serially (exemplified in FIG. 10A byserially-connected diodes 820A in place of diode 820, to raise voltageon the memory array ground plane 142 by the combined threshold voltagesof each diode in the series) or in parallel (exemplified in FIG. 10A byparallel-connected diodes 820B in place of diode 820, e.g., in whicheach diode has the same or different threshold, and selecting one ormore of the diodes provides a programmable threshold voltage by whichthe voltage on the memory array ground plane 142 can be increased).

In an embodiment similar to that of FIG. 10A, memory 860 in FIG. 10Bincludes a positive bias voltage source 840 coupled between the memoryarray ground plane 142 and an external ground potential. Otherwise thememory system 850 and memory 860 are similar or substantially identicalto memory system 800 and memory 810 in FIG. 10A.

In an alternative leakage reduction mode to that illustrated in FIG.10A, the positive bias voltage source 840 is electrically coupled to thememory array ground plane 142, and thus provides a voltage (e.g., VSSM)to the memory array ground plane 142, when the switch 835 isdisconnected. In one embodiment, switch 835 is disconnected when anactive leakage reduction control signal (e.g., PDFVSSM) is asserted atterminal 105. The positive bias voltage source 840 may be a fixedvoltage source (as shown) or a variable voltage source, as long as itprovides a positive bias to the memory array ground plane 142.

The embodiments of FIGS. 10A-B can also be applied to memory systemshaving dual power supplies (e.g., FIGS. 4 and 9B), a memory controller(e.g., FIGS. 4 and 9A-B), a charge pump (e.g., FIG. 8A), and/or avoltage regulator (e.g., FIG. 9A). In addition, the embodiments of FIGS.10A-B can be combined in a single memory, including both the diode 820and the positive bias voltage source 840. Furthermore, the memories 810and 860 of FIGS. 10A-B may include a diode and/or a bias source similarto diode 820 and bias source 840 coupled serially between a power planein the memory array (e.g., 145 in FIG. 10A) and an external powerpotential (e.g., provided by voltage source 150), and a switch coupledto the power plane and the external power potential (e.g., similar toswitches 830 and 835 in FIGS. 10A-B), the switch configured to bypassthe diode or bias source when the memory is in the standard operatingmode. The leakage reduction modes associated with the embodiments ofFIGS. 10A-B can also be combined with other power-down and leakagereduction modes, including disconnecting the peripheral power rail fromthe external power supply (e.g., FIGS. 4, 8B and 9A-10B) and reducingthe voltage on the memory array power rail 145.

Methods of Reducing Power Consumption and Leakage in a Memory

A general method for reducing power consumption and/or leakage in amemory is outlined in the flow chart 900 in FIG. 11. Initially, at 910,a memory performs read and/or write operations in an operational mode,as discussed herein. At 920, if the memory has not conducted any read orwrite operations for a predetermined period of time, the memory canenter a power down mode at 930. Otherwise, the memory continues toperform read and/or write operations at 910. Generally, a lack of thememory read or write operations can be determined by corresponding readenable and write enable signals being deasserted. If both the readenable signal (e.g., NRE) and the write enable signal (e.g., NWE) aredeasserted (see, e.g., 207 in FIG. 3) simultaneously for thepredetermined period of time, an external controller (e.g., 170 in FIG.4) can assert a power-down control signal (e.g., the PDWN waveform at203 in FIG. 3) to place the memory in the power down mode. In variousembodiments, the predetermined period of time for read and writeinactivity is one or two clock cycles (e.g., of a read clock for readoperations and a write clock for write operations, as described herein;see 209 in FIG. 3).

After entering the power down mode at 930, the system or system designerdetermines whether leakage in the memory array is to be reduced byraising the voltage of the ground plane in the memory array at 940. Ifyes, at 950, the system or system designer determines the leakagereduction mode in which the memory is to be placed. If no, the methodproceeds to 960.

In a first leakage reduction mode (Mode1), at 951, the ground plane ofthe memory array is raised by a predetermined amount corresponding to athreshold voltage of a diode, as described herein (e.g., with regard toFIG. 10A). In one embodiment, the memory can be placed in the firstleakage reduction mode by asserting a signal (e.g., PDLVMC) thatdisconnects a switch bypassing a diode having the threshold voltageconnected between the memory array ground plane and an external groundpotential. In various other embodiments, multiple diodes can beconnected between the memory array ground plane and an external groundpotential, in series (e.g., diodes 820A in FIG. 10A in place of diode820) and/or in parallel (e.g., diodes 820B in FIG. 10A in place of diode820), to provide programmable threshold voltages by which the voltage ofthe memory array ground plane can be raised.

In a second leakage reduction mode (Mode2), at 952, the ground plane ofthe memory array is raised by a predetermined or variable amountcorresponding to a positive bias provided by a voltage source, asdescribed herein (e.g., with regard to FIG. 10B). In one embodiment, thememory can be placed in the second leakage reduction mode by asserting asignal (e.g., PDFVSSM) that disconnects a switch bypassing the voltagesource, the voltage source being connected between the memory arrayground plane and an external ground potential. In another embodiment, afurther single-bit, multi-bit or analog control signal determines theamount of the positive bias provided by the power supply by which thememory array ground plane is raised.

At 960, the system or system designer determines whether the voltageprovided to the memory array is at a sufficient or minimum level toretain data in the memory array. If yes, the method ends at 965. If not,the power supplied to the memory array is reduced, as described herein(e.g., as shown at 202 in FIG. 3). For example, referring back to FIGS.4 and 9B, the voltage from variable power supply 160 can be decreased.Alternatively, referring to FIG. 8, the charge pump 520 can be bypassed(similar to the diode 820 in FIG. 10A and/or the positive bias voltagesource 840 in FIG. 10B).

The present disclosure also includes algorithms, computer program(s),computer-readable media, and/or software, implementable and/orexecutable in a general purpose computer or workstation equipped with aconventional digital signal processor, configured to perform one or moreof the methods and/or one or more operations of the hardware disclosedherein. Thus, a further aspect of the methods relate to algorithmsand/or software that implement a method for reducing power consumptionand/or leakage in a memory. For example, the computer program orcomputer-readable medium generally contain a set of instructions which,when executed by an appropriate processing device (e.g., a signalprocessing device, such as a microcontroller, microprocessor or DSPdevice), are configured to perform the above-described method(s) and/oralgorithm(s).

For example, the computer program may be on any kind of readable medium,and the computer-readable medium may comprise any medium (includingnon-transitory media) that can be read by a processing device configuredto read the medium and execute code stored thereon or therein, such as afloppy disk, CD-ROM, magnetic tape or hard disk drive. Such code maycomprise object code, source code and/or binary code. The code forimplementing the present method(s) can comprise (but is not limited to)source code or object code, and can be digital. The code and/orinstructions are generally configured for processing by a conventionaldigital data processor (e.g., a microprocessor, microcontroller, orlogic circuit such as a programmable gate array, programmable logiccircuit/device or application-specific [integrated] circuit).

CONCLUSION/SUMMARY

Thus, embodiments of the present disclosure provide circuits,architectures, apparatuses, systems, methods and software for memorieswith multiple power supplies and/or multiple low power modes. Thepresent disclosure advantageously provides systems with multiple powersupplies to a memory, circuitry and methods for reducing the power(e.g., the operating voltage) to the peripheral circuitry and/or thememory array, for translating signals at a peripheral voltage to amemory array voltage without consuming significant additional area orintroducing current leakage, for reducing the latency of such signaltranslation relative to conventional translation circuitry, and forreducing current leakage in the memory array and/or between the memoryarray and the peripheral circuitry, among others. More specifically, thepresent disclosure provides a dual power supply memory having numerouspower and/or leakage reduction modes and/or low system power (e.g., VDD)operation, while eliminating conventional level shifting circuitry atthe memory array interface and, in single supply memory systems, at thememory module to system control interface. The present disclosure alsoprovides a memory that can operate with a single power supply and havingmultiple power reduction and/or leakage reduction modes.

The foregoing descriptions of embodiments of the present disclosure havebeen presented for purposes of illustration and description. They arenot intended to be exhaustive or to limit the invention to the preciseforms disclosed, and obviously many modifications and variations arepossible in light of the above teaching. The embodiments were chosen anddescribed in order to best explain the principles of the invention andits practical application, to thereby enable others skilled in the artto best utilize the invention and various embodiments with variousmodifications as are suited to the particular use contemplated. It isintended that the scope of the invention be defined by the Claimsappended hereto and their equivalents.

What is claimed is:
 1. A memory, comprising: peripheral circuitrypowered by a first voltage provided by a variable first power supply; amemory array powered by a second voltage provided by a variable secondpower supply; a switch connected between the peripheral circuitry andthe memory array; control circuitry configured to close the switch whenthe first and second voltages are the same and to open the switch whenthe first and second voltages are not the same; and voltage translationcircuitry configured to shift a voltage level of an address signaloutput by the peripheral circuitry, from the first voltage to the secondvoltage for input of the signal by the memory array; wherein the memoryis configured to enter a leakage reduction mode in which the voltagetranslation circuitry is disconnected from power and the second voltageis reduced to reduce current leakage from the memory array to theperipheral circuitry.
 2. The memory of claim 1, wherein the second powersupply is configured to reduce the second voltage during the leakagereduction mode.
 3. The memory of claim 1, wherein the address signal isreceived by the voltage translation circuitry from an address decoder inthe peripheral circuitry.
 4. The memory of claim 1, wherein the voltagetranslation circuitry is configured to bias the second voltage bygrounding a voltage terminal of the peripheral circuitry supplying thefirst voltage.
 5. The memory of claim 1, wherein the voltage translationcircuitry is configured to bias the second voltage by reducing thesecond voltage to a minimum data retention voltage for the memory array.6. The memory of claim 1, wherein the voltage translation circuitry isconfigured to bias the second voltage by coupling a bias voltage sourceto a memory array ground plane.
 7. The memory of claim 1, wherein thevoltage translation circuitry is configured to bias the second voltageby coupling a diode to a memory array ground plane, wherein the diode isconfigured to raise a voltage level of the memory array ground plane bya threshold voltage of the diode.
 8. The memory of claim 1, wherein thesecond voltage is greater than the first voltage.
 9. A method forreducing power consumption in a memory, comprising: powering peripheralcircuitry at a first voltage provided by a variable first power supply;powering a memory array at a second voltage provided by a variablesecond power supply; closing a switch connected between the peripheralcircuitry and the memory array when the first and second voltages arethe same; opening the switch when the first and second voltages are notthe same; shifting, by a translation circuit, a voltage level of anaddress signal, that is output by the peripheral circuitry, from thefirst voltage to the second voltage for input of the signal to thememory array; and entering a leakage reduction mode by disconnectingpower from the translation circuit and by reducing the second voltage toreduce current leakage from the memory array to the peripheralcircuitry.
 10. The method of claim 9, further comprising: disconnectingthe peripheral circuitry from a source of the first voltage in theleakage reduction mode.
 11. The method of claim 9, wherein the secondvoltage is biased by grounding a voltage terminal of the peripheralcircuitry supplying the first voltage.
 12. The method of claim 9,wherein the second voltage is biased by reducing the second voltage to aminimum data retention voltage for the memory array.
 13. The method ofclaim 9, wherein the second voltage is biased by coupling a bias voltagesource to a memory array ground plane.
 14. The method of claim 9,wherein the second voltage is biased by coupling a diode to a memoryarray ground plane, wherein the diode is configured to raise a voltagelevel of the memory array ground plane by a threshold voltage of thediode.
 15. The method of claim 9, wherein the second voltage is greaterthan the first voltage.
 16. The memory of claim 1, further comprising: apower supply output configured to power the memory array; and a firstswitch connected between the power supply output and the peripheralcircuitry to provide the first voltage to the peripheral circuitry.